| Embedded Systems Test Suites -- Technical Data Sheet |
Executive Summary
The Open Group has expanded it's range of test suites
to provide the ability to run them on embedded targets.
This is an opportunity for leading embedded device
suppliers to acquire state-of-the-art test tools to ensure the
development of conformant POSIX®
embedded solutions.
The Open Group is well established as the premier open systems test
supplier and certification authority, developing and owning
tests for the UNIX®, LSBTM and
POSIX® certification programs. As a supplier independent and
product neutral organization, The Open Group is the logical choice in
developing standards-based test suites and certification programs.
The Open Group has a portfolio of test suites
that cover the complete POSIX 1003.1-1996 and 1003.1-2003 standards
and the Single UNIX Specifications.
The Open Group has adapted a number of its test suites
to target embedded devices . These include the VSX4 test suite
(for general POSIX.1 interfaces), the VSRT test suite (for the
POSIX.1b interfaces) and the VSTH test suite (for the POSIX.1c
interfaces). The embedded versions are known as
VSX4-PSE, VSRT-PSE and VSTH-PSE respectively.
Collectively they are also available as a bundle to test the
POSIX 1003.13 profile 52
 more.
Use of test suites is essential for proper development and
maintenance of standards-based products, ensuring conformance of
supplier products to industry-standard APIs, application portability
and interoperability. In-depth testing with Open Group test suites
identifies defects at the earliest possible point in the development
and test cycle minimizing costly defects found in the field.
The embedded test capability allows use of the same rigorous industry
standard tests in a hosted device as for the multi purpose systems.
It allows cross compilation of tests on a host, with uploads
of the test cases to the embedded device, and communication
between the host and the embedded device.
Typically this will take the form of a serial link, although the use of
a faster communication link (such as a network connection) is not
precluded. A simple message-passing protocol is implemented over the
communication channel.
Capabilities included are a test case launcher, a test case
terminator (for systems where exit() is not supported, and a
heartbeat thread.
A white paper is available explaining how the revised TETware
harness has been adapted for testing embedded devices is available at:
http://tetworks.opengroup.org/Wpapers/TETwareRTWhitePaper.htm.
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The Embedded Test Suites includes tests
for
- IEEE POSIX 1003.1-1990 (VSX4-PSE)
- IEEE POSIX 1003.1b-1993/1003.1i-1995 Realtime extension (VSRT-PSE)
- IEEE Std POSIX 1003.1c-1995 Threads (pthreads)
extension (VSTH-PSE)
- IEEE POSIX 1003.13-1998 Profile 52 (VSPSE52)
-
VSPSE52:2003 - A conformance test suite for IEEE
Std 1003.13-2003 Profile PSE52
These test suites have been developed as test packages
under the Test Environment Toolkit and the
VSXgen test framework, allowing them to be run stand-alone, or combined with other relevant
VSXgen test packages.
Test totals are as follows:
VSRT-PSE: 1430 tests
VSTH-PSE: 1232 tests
VSX4-PSE: 5310 tests
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